Magnification Calibration MRS-3 - Cleaning and Re-calibration Service Select:MRS-3/4/5 Cleaning and Re-coating only 2µm Edge radius: ≤10nm Period:

2µm Edge radius: ≤10nm Period: 3 ±0

and afm+ for CAFM measurements and contact mode imaging

lateral force microscopy

Recommended for use with any PeakForce tapping enabled Bruker AFM

2 Cantilever Geometry: Rectangular Cantilevers Number: 1 Front Side Coating: cell Back Side Coating: Reflective Aluminum

Magnification Calibration MRS-3 - Cleaning and Re-calibration Service Select:MRS-3/4/5 Cleaning and Re-coating only 2µm Edge radius: ≤10nm Period:DESCRIPTION MRS 3 X Y R Cleaning, Re coating and Re calibration MRS 3 X Y Z R Cleaning, Re coating and Re calibration MRS 3 4 5 Cleaning and Re coating only The 10 x 50,000x Pitch Standard for Scanning Electron Microscopy Details of Traceability to NIST, NPL or ISO 9000 Compliance Applications Electron microscopy SEM, in both SE and BSE mode, SEM FIB and TEM (with special version) Scanning Microscopies and Profilometry STM, AFM, the pattern height is